DocumentCode :
45628
Title :
A New String Decoding Scheme for Enhancing Array Block Efficiency of Vertical Gate Type (VG-Type) 3-D NAND
Author :
Teng-Hao Yeh ; Chen-Jun Wu ; Chih-Wei Hu ; Wei-Chen Chen ; Hang-Ting Lue ; Yen-Hao Shih ; Ya-Chin King ; Chih-Yuan Lu
Author_Institution :
Macronix Int. Co., Ltd., Hsinchu, Taiwan
Volume :
36
Issue :
4
fYear :
2015
fDate :
Apr-15
Firstpage :
330
Lastpage :
332
Abstract :
The 3-D NAND flash is a path to achieve the highest density and the lowest cost of solid-state nonvolatile memory. Vertical gate type 3-D NAND, one of the 3-D NAND flash memories, has the smallest cell footprint (4F2). We had previously proposed a split page design for selecting NAND strings that incurs an array overhead. In this letter, we propose a new decoding method, using two stagger select string lines to select each NAND string. It greatly reduces the overhead and thus improves efficiency. The array block efficiency after improvement is close to that of conventional 2-D NAND (~ 80 %).
Keywords :
NAND circuits; decoding; flash memories; random-access storage; 2D NAND; VG-type 3D NAND flash memory; array block efficiency; solid-state nonvolatile memory; string decoding scheme; vertical gate type 3D NAND flash memory; Arrays; Decoding; Flash memories; Logic gates; Performance evaluation; Programming; Three-dimensional displays; NAND decoding; VG-type 3D NAND; array block efficiency;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2015.2399107
Filename :
7029055
Link To Document :
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