Title :
Measurements and Improvements of Conducted Electromagnetic Interference Emission Caused by the Switching Circuit
Author :
Lu, Yuh-Yih ; Chen, Zhi-Hua ; Yeh, Chung-Hsiung ; Huang, Hsiang-Cheh
Author_Institution :
Dept. of Electr. Eng., Minghsin Univ. of Sci. & Technol., Hsin-Chu
fDate :
Aug. 30 2006-Sept. 1 2006
Abstract :
In general, the conducted electromagnetic interference (EMI) emission exists in most of the electronic products and affects the electromagnetic environments. In this paper, we design a switching circuit to observe and improve the conducted EMI emission. We also discuss the conducted EMI effects with putting RC snubber or diode into the switching circuit. It is found that the switching circuits with RC snubber or diode can reduce the conducted EMI effect and accord with the limitations of FCC Part 15 Class B and EN 55011 Class B
Keywords :
electromagnetic compatibility; electromagnetic interference; snubbers; switching circuits; EMI; EN 55011 Class B; FCC Part 15 Class B; RC snubber; conducted electromagnetic interference emission; electromagnetic environment; switching circuit; Circuit noise; Circuit testing; Consumer electronics; Diodes; Electromagnetic interference; Electromagnetic measurements; Pollution measurement; Snubbers; Switching circuits; Working environment noise;
Conference_Titel :
Innovative Computing, Information and Control, 2006. ICICIC '06. First International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7695-2616-0
DOI :
10.1109/ICICIC.2006.113
