DocumentCode :
45689
Title :
Analytical Solutions for Distributed Interconnect Models—Part I: Step Input Response of Finite and Semi-Infinite Lines
Author :
Behrouzian, Amir Reza Baghban ; Masoumi, Nasser
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
Volume :
22
Issue :
12
fYear :
2014
fDate :
Dec. 2014
Firstpage :
2596
Lastpage :
2606
Abstract :
With Fourier series and Fourier integrals, a new and systematic approach, called the Amir and Nasser (AMN) method, is proposed to derive exact analytical expressions for step input response of distributed resistance capacitance (RC), inductance-capacitance (LC), and resistance-inductance-capacitance (RLC) models of interconnects. These solutions are obtained for time-domain responses of any arbitrary point on a finite interconnect line, considering initial voltage through the line. This method is appropriate for both on-chip and printed circuit board wires without any limitations in their length or characteristic parameters. The developed solutions are expressed as infinite summation of sinusoidal terms. An accuracy of over 99.5% is observed for the expressions compared with the HSPICE simulations for at most a number of several tens of sinusoidal terms for Fourier series. It is shown that ignoring the initial voltage through the line leads to considerable error as high as 33% at the far end voltage in global interconnects for 65-nm technology node. The AMN method is extended to semi-infinite distributed RC and RLC interconnects for which exact closed-form expressions are achieved.
Keywords :
Fourier series; SPICE; printed circuits; AMN method; Amir and Nasser method; Fourier integrals; Fourier series; HSPICE simulations; closed-form expressions; distributed interconnect models; finite interconnect line; finite-infinite lines; printed circuit board wires; resistance capacitance models; resistance-inductance-capacitance models; semi-infinite lines; size 65 nm; Analytical models; Equations; Integrated circuit interconnections; Integrated circuit modeling; Mathematical model; Transient response; Wires; Amir and Nasser (AMN) method; Fourier analysis; VLSI; VLSI.; distributed circuit; initial conditions; resistance-inductance-capacitance (RLC) interconnect; semi-infinite line; signal integrity; time domain analysis; transmission line;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2013.2280816
Filename :
6626612
Link To Document :
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