• DocumentCode
    457253
  • Title

    Invariant Ridgelet-Fourier Descriptor for Pattern Recognition

  • Author

    Chen, G.Y. ; Bui, T.D. ; Krzyzak, A.

  • Author_Institution
    Dept. of Comput. Sci., Concordia Univ., Montreal, Que.
  • Volume
    2
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    768
  • Lastpage
    771
  • Abstract
    In this paper, we present a novel descriptor for feature extraction by using a combination of ridgelets and Fourier transform. We have successfully implemented ridgelets on the circular disk containing the pattern and applied Fourier transform on the resulting ridgelet coefficients to extract rotation-invariant features for pattern recognition. The descriptor is very robust to Gaussian noise even when the noise level is high. Experimental results show that the new descriptor is a very good choice for pattern recognition
  • Keywords
    Fourier transforms; Gaussian noise; feature extraction; Fourier transform; Gaussian noise; circular disk; invariant ridgelet-Fourier descriptor; pattern recognition; ridgelet coefficients; ridgelet transform; rotation-invariant feature extraction; Computer science; Feature extraction; Fourier transforms; Gaussian noise; Image analysis; Noise level; Noise robustness; Pattern analysis; Pattern recognition; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-2521-0
  • Type

    conf

  • DOI
    10.1109/ICPR.2006.722
  • Filename
    1699318