Title :
Inspecting Ingredients of Starches in Starch-Noodle based on Image Processing and Pattern Recognition
Author :
Guo, Mingen ; Ou, Zongying ; Wei, Honglei
Author_Institution :
Key Lab. for Precision & Non-traditional Machining Technol. of Minist. of Educ., Dalian Univ. of Technol.
Abstract :
Inspecting what sort of starch in commercial starch-noodles is important to international trade, food safety and protecting consumer benefit. At present, the inspection of components of starches in starch-noodle mainly relies on sensory perception, and which is fallibility or trustless. Because the microstructure pattern of starches in starch-noodles depends mainly on a kind or blend of starches from which the starch-noodle was made, this paper presents an approach to classify the starch-noodles by using computer system automatically based on recognizing the microstructure pattern of the starches and components in starch-noodle. The method consists of three steps: 1) take the micrograph of starch-noodles with scanning electron microscopy and preprocessing. 2) Extract features of fractal geometry and gray-level co-occurrence from micrograph. 3) Distinguish a sort of starch-noodles by using these combined features as input vector of artificial neural networks. The experiments has been conducted with starch-noodles of mungbean blending pachyrhizus, and the experimental results show that the method is practicable and effective
Keywords :
feature extraction; fractals; image classification; inspection; matrix algebra; neural nets; scanning electron microscopes; sugar; artificial neural networks; computer system; feature extraction; fractal geometry; gray-level cooccurrence; image processing; microstructure pattern recognition; scanning electron microscopy; scanning electron preprocessing; sensory perception; starch ingredients; starch inspection; starch microstructure pattern; starch-noodle classification; starch-noodle micrograph; Data preprocessing; Feature extraction; Image processing; Inspection; International trade; Microstructure; Pattern recognition; Protection; Safety; Scanning electron microscopy;
Conference_Titel :
Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
0-7695-2521-0
DOI :
10.1109/ICPR.2006.714