Title :
Extraction of Consistent Subsets of Descriptors using Choquet Integral
Author :
Rendek, J. ; Wendling, L.
Author_Institution :
LORIA, Univ. de Nancy I, Villers-les-Nancy
Abstract :
This paper presents a novel approach to automatically extract a subset of shape descriptors dedicated to an application under consideration. Basic descriptors having low time processing and allowing to keep nice geometric properties were implemented. Then a model based on Choquet integral and Shapley values, are proposed to select suitable descriptors. Experimental studies using real databases attest of the robustness of our approach
Keywords :
integral equations; pattern recognition; Choquet integral; Shapley value; shape descriptor subset extraction; Euclidean distance; Fourier transforms; Pattern matching; Pattern recognition; Photometry; Principal component analysis; Research and development; Robustness; Shape measurement; Spatial databases;
Conference_Titel :
Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
0-7695-2521-0
DOI :
10.1109/ICPR.2006.521