• DocumentCode
    457474
  • Title

    Stochastic Framework for Symmetric Affine Matching between Point Sets

  • Author

    Yeung, Sai Kit ; Shi, Pengcheng

  • Author_Institution
    Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol.
  • Volume
    3
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    790
  • Lastpage
    793
  • Abstract
    This paper presents a new approach to obtain symmetry in point matching problem. Here, symmetric matching means the essential property that the choices of source and target should not determine the eventual matching results. Most earlier approaches to achieve symmetric matching have been in deterministic fashions, where symmetry constraints are added into the matching cost functions to impose source-target symmetric property during the matching process. Nevertheless, these modified cost functions cannot generally converge to real ground truth, and further, the perfect source-target symmetry cannot be achieved. Given initial forward and backward matching matrices pair, computed from any reasonable matching strategies, our approach yields perfectly symmetric mapping matrices from a stochastic framework that simultaneously considers the errors underneath the initial matching matrices and the imperfectness of the symmetry constraint. An iterative generalized total least square (GTLS) strategy has been developed such that perfect source-target symmetry is imposed
  • Keywords
    image matching; image registration; iterative methods; least squares approximations; stochastic processes; iterative generalized total least square; matching cost functions; matching matrices; point matching problem; source-target symmetric property; stochastic framework; symmetric affine matching; Biomedical computing; Biomedical engineering; Cost function; Educational institutions; Iterative algorithms; Iterative closest point algorithm; Least squares methods; Simultaneous localization and mapping; Stochastic processes; Symmetric matrices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-2521-0
  • Type

    conf

  • DOI
    10.1109/ICPR.2006.1080
  • Filename
    1699644