Title : 
Joint Optimization of Image Registration and Comparametric Exposure Compensation Based on the Lucas-Kanade Algorithm
         
        
            Author : 
Kim, Dong Sik ; Lee, Su Yeon ; Lee, Kiryung
         
        
            Author_Institution : 
Sch. of Electron. & Inf. Eng., Hankuk Univ. of Foreign Studies, Gyonggi-do
         
        
        
        
        
        
        
            Abstract : 
An iterative registration algorithm, the Lucas-Kanade algorithm, is combined with an exposure compensation algorithm to jointly optimize the spatial registration and the exposure compensation. The coordinate descent method is employed to minimize a mean squared error between image pairs. Based on a simple regression model, a non-parametric estimator, the empirical conditional mean and its polynomial fitting are used as histogram transformation functions for the exposure compensation. The proposed algorithm performs a good registration for real perspective and microscopic images, and can easily adopt other exposure compensation approaches and variations of the Lucas-Kanade algorithms due to its implicit flexibility
         
        
            Keywords : 
image registration; iterative methods; mean square error methods; optimisation; polynomials; regression analysis; Lucas-Kanade algorithm; comparametric exposure compensation; coordinate descent method; histogram transformation functions; image registration; iterative registration algorithm; joint optimization; mean squared error; microscopic images; nonparametric estimator; polynomial fitting; regression model; spatial registration; Biomedical imaging; Computer vision; Equations; Histograms; Image registration; Iterative algorithms; Layout; Microscopy; Pixel; Polynomials;
         
        
        
        
            Conference_Titel : 
Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
         
        
            Conference_Location : 
Hong Kong
         
        
        
            Print_ISBN : 
0-7695-2521-0
         
        
        
            DOI : 
10.1109/ICPR.2006.735