Title :
Detecting irregularities in regular patterns
Author :
Vartiainen, J. ; Sadovnikov, A. ; Lensu, L. ; Kamarainen, J.-K. ; Kalviainen, Heikki
Author_Institution :
Dept. of Inf. Technol., Lappeenranta Univ. of Technol.
Abstract :
This study compares three different methods designed for detecting irregularities from regular dot patterns. Frequency domain information is used to split an original regular pattern into two images: the first image contains the perfect repeating pattern and the second one includes all irregularities in the original image. The methods are based on the Fourier transform, but they differ in how they separate or utilize the regular and irregular image parts. Performances of these methods are compared, and their strengths and weaknesses are discussed
Keywords :
Fourier transforms; pattern recognition; Fourier transform; frequency domain information; perfect repeating pattern; regular dot patterns; Fourier transforms; Frequency domain analysis; Information filtering; Information filters; Information technology; Ink; Inspection; Lattices; Shape; Testing;
Conference_Titel :
Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
0-7695-2521-0
DOI :
10.1109/ICPR.2006.432