• DocumentCode
    457534
  • Title

    Face Alignment Using Segmentation and a Combined AAM in a PTZ Camera

  • Author

    Choi, Kwontaeg ; Ahn, Jung-Ho ; Byun, Hyeran

  • Author_Institution
    Dept. Of Comput. Sci., Yonsei Univ.
  • Volume
    3
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    1191
  • Lastpage
    1194
  • Abstract
    In this paper, we propose a novel framework for face alignment based on the active appearance model (AAM) in surveillance systems with pan-tilt-zoom (PTZ) cameras. The AAM converges poorly in face images which are affected by illumination factors, cluttered backgrounds and status of the camera. To search for robust face model parameters, we propose a robust AAM fitting method based on segmenting faces and combining person-specific and generic models to achieve accurate face alignment. We segment faces using histogram back-projection and a skin color histogram, which is updated using a skin mask extracted by the AAM. For robust face recognition, we combined generic and person-specific models with a slight reduction in processing time. The extracted AAM parameters are as accurate as those when using the person-specific model and can be used as features for face recognition. Empirical experiments show that our proposed method extracts very accurate face parameters and is not sensitive to initial shapes
  • Keywords
    face recognition; image segmentation; surveillance; cluttered backgrounds; face alignment; face images; face model parameters; face parameter extraction; face recognition; face segmentation; histogram back-projection; illumination factors; pan-tilt-zoom cameras; person-specific models; robust active appearance model fitting; skin color histogram; skin mask; surveillance systems; Active appearance model; Cameras; Face recognition; Histograms; Image converters; Image segmentation; Lighting; Robustness; Skin; Surveillance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-2521-0
  • Type

    conf

  • DOI
    10.1109/ICPR.2006.523
  • Filename
    1699739