Title :
High-frequency RFID tags: an analytical and numerical approach for determining the induced currents and scattered fields
Author :
Braaten, Benjamin D. ; Feng, Yuxin ; Nelson, Robert M.
Author_Institution :
North Dakota State Univ
Keywords :
Circuits; Electromagnetic compatibility; Electromagnetic radiation; Electromagnetic scattering; Frequency; Impedance; Passive RFID tags; Pervasive computing; RFID tags; Radiofrequency identification;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
DOI :
10.1109/ISEMC.2006.1706263