• DocumentCode
    457577
  • Title

    Influence of an extended stub at connector ports on signal launches and TRL de-embedding

  • Author

    Jianmin Zhang ; Drewniak, James L. ; Pommerenke, David J. ; Zhiping Yang

  • Author_Institution
    University of Missouri
  • Volume
    1
  • fYear
    2006
  • fDate
    14-18 Aug. 2006
  • Firstpage
    172
  • Lastpage
    177
  • Keywords
    Calibration; Connectors; Dielectric loss measurement; Dielectric measurements; Dielectric substrates; Frequency measurement; Testing; Time domain analysis; Transmission line discontinuities; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    1-4244-0293-X
  • Type

    conf

  • DOI
    10.1109/ISEMC.2006.1706286
  • Filename
    1706286
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=457577