DocumentCode :
457582
Title :
Time domain gating of frequency domain S-parameter data to remove connector end effects for PCB and cable applications
Author :
Archambeault, Bruce ; Connor, Samuel ; Diepenbrock, Joseph C.
Author_Institution :
IBM
Volume :
1
fYear :
2006
fDate :
14-18 Aug. 2006
Firstpage :
199
Lastpage :
202
Keywords :
Calibration; Communication cables; Connectors; Dielectric loss measurement; Frequency domain analysis; Length measurement; Loss measurement; Reflection; Resonance; Scattering parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
Type :
conf
DOI :
10.1109/ISEMC.2006.1706292
Filename :
1706292
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=457582
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