DocumentCode
457605
Title
Signal link-path characterization up to 20 GHz based on a stripline structure
Author
Zhang, Jianmin ; Drewniak, James L. ; Pommerenke, David J. ; Dubroff, Richard E. ; Yang, Zhiping ; Cheng, Wheling ; Fisher, John ; Camerlo, Sergio
Author_Institution
University of Missouri
Volume
2
fYear
2006
fDate
14-18 Aug. 2006
Firstpage
356
Lastpage
361
Keywords
Conducting materials; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectric substrates; Dispersion; Frequency; Material properties; Stripline;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location
Portland, OR, USA
Print_ISBN
1-4244-0293-X
Type
conf
DOI
10.1109/ISEMC.2006.1706327
Filename
1706327
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