• DocumentCode
    45772
  • Title

    Write Scheme Allowing Reduced LRS Nonlinearity Requirement in a 3D-RRAM Array With Selector-Less 1TNR Architecture

  • Author

    Chen, F.T. ; Yu-Sheng Chen ; Tai-Yuan Wu ; Tzu-Kun Ku

  • Author_Institution
    Ind. Technol. Res. Inst., Hsinchu, Taiwan
  • Volume
    35
  • Issue
    2
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    223
  • Lastpage
    225
  • Abstract
    A 3-D resistive random access memory potentially offers lowest cost per bit and highest bit density memory architecture without the use of transistors in the array. However, without the use of selectors attached to each cell in the array, sneak currents are a key concern, causing signal errors, and excess power dissipation. A nonlinear LRS helps to resolve the issue, but to date, reported LRS nonlinearity values are still insufficient. In this letter, we describe how a 1TNR architecture may be designed and operated to take more advantage of the HRS rather than the LRS nonlinearity, allowing sneak currents to be minimized during write operations, without the use of cell selectors. We show how a recently studied TaOx/HfOx device with highly nonlinear ( ~ 105) HRS can be used in block sizes up to 256 Mb without selectors in a 1T8R architecture with a 25% current margin.
  • Keywords
    hafnium compounds; memory architecture; random-access storage; tantalum compounds; 3D RRAM array; TaO-HfO; bit density memory architecture; cell selectors; excess power dissipation; nonlinear LRS; reduced LRS nonlinearity requirement; resistive random access memory; selectorless 1TNR architecture; signal errors; sneak currents; Arrays; Ash; Microprocessors; Resistance; Three-dimensional displays; Transistors; RRAM; resistive memory;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2013.2294809
  • Filename
    6701133