Title :
Contactless Liquid-Level Measurement With Frequency-Modulated Millimeter Wave Through Opaque Container
Author :
Nakagawa, T. ; Hyodo, A. ; Kogo, Kenji ; Kurata, H. ; Osada, K. ; Oho, S.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Koganei, Japan
Abstract :
A novel contactless method for measuring liquid level through an opaque container is proposed. A millimeter-wave Doppler sensor is developed to “see” (i.e., sense) through a target container and measure the liquid level on the basis of the absorption of millimeter waves in liquid. One of the challenges is to accurately measure liquid level (within sub-millimeter error) despite the inherently large beam diameter of the millimeter wave due to diffraction. A piezoelectric vibrator enables accurate measurement by reflecting a limited portion of the spread beam and modulating it in frequency to distinguish it from the other portion of the beam. A prototype measurement system is fabricated and evaluated. The feasibility of our proposed method for clearly detecting an air-liquid interface concealed in an opaque container is confirmed experimentally. The nonlinearity error of the measured liquid level is within ±0.5 mm .
Keywords :
Doppler measurement; absorption; containers; frequency measurement; frequency modulation; level measurement; measurement errors; millimetre wave detectors; millimetre wave measurement; piezoelectric transducers; vibration measurement; air-liquid interface; contactless liquid-level measurement; diffraction; distance -0.5 mm; distance 0.5 mm; frequency-modulated millimeter wave measurement; large beam diameter; millimeter wave absorption; millimeter-wave Doppler sensor; opaque container; piezoelectric vibrator; spread beam portion; submillimeter error; vibration measurement; Containers; Doppler effect; Liquids; Millimeter wave measurements; Millimeter wave technology; Sensors; Ultrasonic variables measurement; Contactless sensing; frequency modulation; liquid-level measurement; millimeter wave;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2012.2220346