• DocumentCode
    460152
  • Title

    Tunnel Diode Revealing Peculiarities at I-V Measurements in Multijunction III-V Solar Cells

  • Author

    Andreev, V.M. ; Ionova, E.A. ; Larionov, V.R. ; Rumyantsev, V.D. ; Shvarts, M.Z. ; Glenn, G.

  • Author_Institution
    Ioffe Physico-Tech. Inst.
  • Volume
    1
  • fYear
    2006
  • fDate
    38838
  • Firstpage
    799
  • Lastpage
    802
  • Abstract
    This work reports on various approaches to illuminated I-V curve measurements in monolithic dual and triple-junction GaInP/GaAs/Ge cells with the aim of revealing the action of interconnecting tunnel diodes. The measurements were performed both for model samples using a combination of individual sub-cells, connected through an external tunnel diode and for practical concentrator cells with different peak current densities (Jp) of the tunnel diodes in a monolithic structure. Changing of load resistance, or changing of applied voltage from an external source, characterized by variable resistance, was used to obtain I-V curves under both continuous and flash illumination. Also, variation of cell internal resistance due to the current mismatch in sub-cells, caused by illumination spectrum variation, was proven by these measurements
  • Keywords
    III-V semiconductors; current density; elemental semiconductors; gallium arsenide; gallium compounds; germanium; semiconductor junctions; solar cells; tunnel diodes; GaInP-GaAs-Ge; cell internal resistance; concentrator cells; current densities; flash illumination; load resistance; monolithic dual-junction cells; monolithic structure; multijunction III-V solar cells; triple-junction cells; tunnel diode; tunnel diodes; variable resistance; Current measurement; Density measurement; Diodes; Electrical resistance measurement; Gain measurement; Gallium arsenide; III-V semiconductor materials; Lighting; Performance evaluation; Photovoltaic cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
  • Conference_Location
    Waikoloa, HI
  • Print_ISBN
    1-4244-0017-1
  • Electronic_ISBN
    1-4244-0017-1
  • Type

    conf

  • DOI
    10.1109/WCPEC.2006.279577
  • Filename
    4059750