DocumentCode :
460178
Title :
PECVD Silicon Nitride Surface Passivation for High-Efficiency N-Type Silicon Solar Cells
Author :
Chen, Florence W. ; Li, Tsu Tsung A ; Cotter, Jeffrey E.
Author_Institution :
Centre for Excellence for Adv. Silicon Photovoltaic & Photonics, New South Wales Univ., Syndey, NSW
Volume :
1
fYear :
2006
fDate :
38838
Firstpage :
1020
Lastpage :
1023
Abstract :
In this paper, we show that plasma-enhanced chemical vapor deposited silicon nitride is particularly well suited for surface passivation of n-type silicon wafers and solar cells. The surface passivation quality provided by the silicon nitride on three different important surfaces for high-efficiency n-type solar cells is studied in this work: planar, textured, and boron-diffused surfaces. Exceptional passivation quality on these surfaces is demonstrated in this work. One-sun implied open-circuit voltages of 732 mV, 719 mV, and 683 mV were achieved on 1 ohm.cm planar, 1 ohm.cm textured, and moderately doped (135 ohm/sq) boron-diffused planar surfaces, respectively. A real open-circuit voltage of 719 mV was measured at approximately 1-Sun, 25 degC condition on a voltage test structure device passivated entirely with silicon nitride
Keywords :
elemental semiconductors; passivation; plasma CVD; silicon; silicon compounds; solar cells; 25 C; 683 mV; 719 mV; 732 mV; Si; SiN-Si:B; boron-diffused surfaces; high-efficiency n-type silicon solar cells; n-type silicon wafers; open-circuit voltages; plasma-enhanced chemical vapor deposited silicon nitride; surface passivation; Boron; Chemicals; Hafnium; Passivation; Photovoltaic cells; Plasma chemistry; Silicon compounds; Surface texture; Surface treatment; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
Type :
conf
DOI :
10.1109/WCPEC.2006.279292
Filename :
4059804
Link To Document :
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