Title :
Silicon Solar Cells using Silicon Oxynitride (SIO2:N) for Emitter Surface Passivation
Author :
Morales-Acevedo, Arturo ; Perez-Sanchez, G. Francisco
Author_Institution :
Electr. Eng. Dept., CINVESTAV-IPN, Mexico City
Abstract :
Surface passivation in silicon solar cells is an important step for achieving high efficiencies as a consequence of a reduced dark saturation current density simultaneously with an increased illumination current density. One of the methods more often used to achieve such surface passivation is the deposition of thin silicon oxide films on the top surface of the emitter of silicon solar cells. More recently, silicon nitride has been also used, but the reduction of the surface density of states has not been as good as with high quality thermal silicon oxide layers. On the other hand, it has been shown that small quantities of nitrogen introduced in the silicon oxide films may help to reduce such density of states. In this work, we compare the results for silicon solar cells prepared without any silicon oxide layer, cells with a thermal silicon oxide film on the emitter and cells prepared with a passivating silicon oxynitride layer (SiO2:N), showing that the best efficiency is achieved in the last case
Keywords :
antireflection coatings; current density; dark conductivity; elemental semiconductors; passivation; silicon; silicon compounds; solar cells; thin films; titanium compounds; Si; SiO2:N; TiO2; antireflection coatings; dark saturation current density; silicon nitride; silicon oxynitride; silicon solar cells; surface density of states; surface passivation; thermal silicon oxide layers; thin silicon oxide films; Current density; Nitrogen; Optical films; Oxidation; Passivation; Photovoltaic cells; Semiconductor films; Silicon; Spraying; Temperature;
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
DOI :
10.1109/WCPEC.2006.279427