Title :
Study and Estimation of Crystal Oscillator Phase Jitter
Author :
Wei, Wei ; Huang, Xianhe ; Tan, Feng ; Rong, Qilong
Author_Institution :
Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu
Abstract :
As the interest of crystal oscillator (XO) designers, fundamental studies of jitter are systematically presented in this paper. The phase jitter, which is a quite vital index in communication systems, results in errors in measurements and specifications of crystal oscillators(XOs) and other high-stability signal sources. Although advances have been made in comprehending the conception of phase jitter, the gas between the theoretical understanding and the practical measurement still exists. In this work, analyses of timing jitter, specified as a statistical parameter, are introduced. This leads to the phase jitter separation and its accumulation in XOs. Relationships between the phase noise and the frequency-domain jitter measurement, phase jitter and time jitter are described using detailed analyses. Especially, a diagrammatic solution resulting from integrating the phase noise is put up so that the phase jitter is simply estimated without measuring phase jitter itself. The experiment demonstrates the good agreement between estimated values and measured results
Keywords :
crystal oscillators; frequency-domain analysis; phase noise; signal classification; source separation; timing jitter; communication systems; crystal oscillator phase jitter; frequency-domain jitter measurement; high-stability signal sources; jitter classification; measurement errors; phase jitter estimation; phase jitter separation; phase noise; statistical parameter; timing jitter analysis; Communication systems; Frequency domain analysis; Frequency measurement; Noise measurement; Oscillators; Phase estimation; Phase measurement; Phase noise; Time measurement; Timing jitter;
Conference_Titel :
Communications, Circuits and Systems Proceedings, 2006 International Conference on
Conference_Location :
Guilin
Print_ISBN :
0-7803-9584-0
Electronic_ISBN :
0-7803-9585-9
DOI :
10.1109/ICCCAS.2006.284637