Title :
Study of Differential Evolution on ATPG
Author :
Chuanpei, Xu ; Zhi, Li ; Wei, Mo
Author_Institution :
Dept. of Electron. Eng., Guilin Univ. of Electron. Technol.
Abstract :
As a new heuristic approach, differential evolution has shown superior performance in continuous space capable of handling nondifferentiable, nonlinear and multimodal objective functions. This paper reports a study of DE to operate on discrete binary variables, which are test patterns of sequential circuits. Preliminary experimental results of automatic test pattern generation (ATPG) for sequential circuits based on DE are provided and comparisons are discussed
Keywords :
automatic test pattern generation; circuit testing; sequential circuits; ATPG; automatic test pattern generation; differential evolution; discrete binary variables; sequential circuits; Automatic test pattern generation; Circuit testing; Concurrent computing; Equations; Evolutionary computation; Genetic algorithms; Genetic mutations; Sequential analysis; Sequential circuits; Space technology;
Conference_Titel :
Communications, Circuits and Systems Proceedings, 2006 International Conference on
Conference_Location :
Guilin
Print_ISBN :
0-7803-9584-0
Electronic_ISBN :
0-7803-9585-9
DOI :
10.1109/ICCCAS.2006.284909
