DocumentCode :
461699
Title :
Using Bayesian Classifiers to Enhance Clustering
Author :
Wang, Weihong ; Li, Qu ; Han, Shanshan ; Zheng, Xuezhi
Author_Institution :
Software Coll., Zhejiang Univ. of Technol., Hangzhou
Volume :
3
fYear :
2006
fDate :
16-20 2006
Abstract :
Recently, combining Naive-Bayes with the expectation maximization (EM) algorithm for unsupervised learning have received significant attention. AutoClass is a classical Bayesian clustering algorithm that uses Naive-Bayes in combination with EM algorithm to find the probability distribution parameters to best fit the data. In this study, we introduce a robust approach, which is similar to AutoClass, it can arbitrarily impose any Bayesian classifiers in combination with EM algorithm to enhance cluster´s performance. This paper focuses on how clustering techniques can benefit from classification. We provide experimental evidence that more accurate than original results of clustering in the t-test on most of the benchmark data sets
Keywords :
Bayes methods; expectation-maximisation algorithm; pattern classification; pattern clustering; probability; unsupervised learning; Bayesian classifiers; Naive-Bayes; expectation maximization algorithm; probability distribution parameters; unsupervised learning; Bayesian methods; Clustering algorithms; Distributed computing; Educational institutions; Geology; Probability density function; Probability distribution; Robustness; Unsupervised learning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Processing, 2006 8th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-9736-3
Electronic_ISBN :
0-7803-9736-3
Type :
conf
DOI :
10.1109/ICOSP.2006.345772
Filename :
4129238
Link To Document :
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