• DocumentCode
    461699
  • Title

    Using Bayesian Classifiers to Enhance Clustering

  • Author

    Wang, Weihong ; Li, Qu ; Han, Shanshan ; Zheng, Xuezhi

  • Author_Institution
    Software Coll., Zhejiang Univ. of Technol., Hangzhou
  • Volume
    3
  • fYear
    2006
  • fDate
    16-20 2006
  • Abstract
    Recently, combining Naive-Bayes with the expectation maximization (EM) algorithm for unsupervised learning have received significant attention. AutoClass is a classical Bayesian clustering algorithm that uses Naive-Bayes in combination with EM algorithm to find the probability distribution parameters to best fit the data. In this study, we introduce a robust approach, which is similar to AutoClass, it can arbitrarily impose any Bayesian classifiers in combination with EM algorithm to enhance cluster´s performance. This paper focuses on how clustering techniques can benefit from classification. We provide experimental evidence that more accurate than original results of clustering in the t-test on most of the benchmark data sets
  • Keywords
    Bayes methods; expectation-maximisation algorithm; pattern classification; pattern clustering; probability; unsupervised learning; Bayesian classifiers; Naive-Bayes; expectation maximization algorithm; probability distribution parameters; unsupervised learning; Bayesian methods; Clustering algorithms; Distributed computing; Educational institutions; Geology; Probability density function; Probability distribution; Robustness; Unsupervised learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing, 2006 8th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    0-7803-9736-3
  • Electronic_ISBN
    0-7803-9736-3
  • Type

    conf

  • DOI
    10.1109/ICOSP.2006.345772
  • Filename
    4129238