Title : 
VELA: the CMOS circuit based on fast current read-out for X-ray Spectroscopy with DePMOS
         
        
            Author : 
Bombelli, L. ; Fiorini, C. ; Porro, M. ; Longoni, A. ; Herrmann, S. ; Wölfel, S. ; Strüder, L. ; Buttler, W.
         
        
            Author_Institution : 
Dipt. di Elettronica e Informazione, Politecnico di Milano
         
        
        
        
            fDate : 
Oct. 29 2006-Nov. 1 2006
         
        
        
        
            Abstract : 
DePMOS based Active Pixel Sensor (APS) matrix is a new detector concept for X-ray imaging spectroscopy applications. This type of X-ray detectors can provide excellent energy resolution and high-speed readout. Both these features and the advantage of random pixel accessibility can fulfill the requirements of new space missions, like the XEUS Wide Field Imager. In a matrix arrangement, each pixel must be read out by a time variant filter, so a new readout mechanism and a proper multi-channel integrated shaping amplifier are needed. Finally, to operate at such a reduced processing time (e.g. 4 mus per line) DePMOS transistor can not be operated in the classical source follower configuration, because this results in a long settling time; so challenging design of full-custom multi-channel readout electronic has to be considered. We propose a new faster readout concept, which is based on the drain current readout.
         
        
            Keywords : 
X-ray imaging; X-ray spectroscopy; readout electronics; semiconductor counters; CMOS circuit; DePMOS transistor; VELA; X-ray detectors; X-ray imaging spectroscopy application; X-ray xpectroscopy; XEUS wide field imager; active pixel sensor; fast current read-out; multichannel readout electronic; CMOS image sensors; Circuits; Energy resolution; Image sensors; Pixel; Space missions; Spectroscopy; X-ray detection; X-ray detectors; X-ray imaging;
         
        
        
        
            Conference_Titel : 
Nuclear Science Symposium Conference Record, 2006. IEEE
         
        
            Conference_Location : 
San Diego, CA
         
        
        
            Print_ISBN : 
1-4244-0560-2
         
        
            Electronic_ISBN : 
1095-7863
         
        
        
            DOI : 
10.1109/NSSMIC.2006.355949