Title :
Radiation Detectors for HEP Applications Using Standard CMOS Technology
Author :
Passeri, D. ; Marras, A. ; Placidi, P. ; Delfanti, P. ; Biagetti, D. ; Servoli, L. ; Bilei, G.M. ; Ciampolini, P.
Author_Institution :
Dipt. di Ingegneria Elettronica e dell´´Informazione, Universita di Perugia
fDate :
Oct. 29 2006-Nov. 1 2006
Abstract :
The suitability of standard CMOS technology featuring no epitaxial layer for particle detection has been investigated through extensive experimental characterization. Different pixel layout and read-out schemes have been devised and implemented, as well as different test strategies. In this work test results are reported concerning the response of the detector to IR laser, beta-particles and X-rays stimuli, thus confirming the suitability of the proposed approach for high energy physics applications.
Keywords :
CMOS integrated circuits; nuclear electronics; semiconductor counters; CMOS technology; HEP applications; high energy physics; particle detection; radiation detectors; CMOS technology; Laser noise; Optical noise; Optical sensors; Radiation detectors; Semiconductor device noise; Semiconductor lasers; Sensor arrays; Testing; X-rays;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2006.356071