A New High-Speed, Single Photon Imaging CCD for the Optical

We report on first measurements from test structures verifying a new design concept of a single photon imaging CCD for the optical. The results confirm the sensitivity of a novel avalanche diode to single electrons. Details of this structure which can be combined with a back illuminated sensor are described, measurement results include I-V curves, dark rate and temperature dependency. In addition an avalanche diode with MOSFET readout will be presented as well as an ultra low noise pnCCD which is process compatible. The successful testing of these components proves the feasibility to produce a back-illuminated single photon sensitive CCD with high frame rates and high sensitivity in a wide wavelength range.