Title :
Impact of Photon Transport Properties on the Detection Efficiency of Scintillator Arrays
Author :
Wirth, Stefan ; Metzger, Wilhelm ; Pham-Gia, Khanh ; Heismann, Bjorn J.
Author_Institution :
Div. of Computed Tomography, Siemens Med. Solutions, Forchheim
fDate :
Oct. 29 2006-Nov. 1 2006
Abstract :
For spatially resolved X- and gamma ray detection pixelated scintillator arrays are used. In this study we simulate the quantum gain process of a scintillator array and its impact on the detective quantum efficiency of the detector system. The simulation tool comprises a full physical Monte-Carlo model of the X-ray interactions as well as the transport processes of the scintillation photons within the detector system. As an example, we analyze an Gd2O2S:Pr scintillator array with typical 1 mm pixel pitch and TiO2 based reflective material. The results indicate that for integrating systems fluorescence escape effects play a major role in the noise performance of scintillating pixel detectors. Additionally, the light generation and transport processes can have an impact on the signal-to-noise ratio.
Keywords :
Monte Carlo methods; X-ray detection; gadolinium compounds; gamma-ray detection; photon transport theory; praseodymium; scintillation counters; titanium compounds; Gd2O2S:Pr; Monte Carlo model; TiO2; X-ray detection pixelated scintillator arrays; X-ray interactions; detection efficiency; detector quantum efficiency; fluorescence escape; gamma ray detection pixelated scintillator arrays; light generation; photon transport properties; praseodymium doped digadolinium dioxide scintillator array; quantum gain process; scintillating pixel detectors; scintillation photons; signal-noise ratio; titania based reflective material; transport processes; Electromagnetic wave absorption; Gamma ray detection; Optical crosstalk; Optical materials; Optical scattering; Optical sensors; Photodiodes; Solid scintillation detectors; X-ray detection; X-ray detectors;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2006.354440