DocumentCode :
462970
Title :
Tracing the Defect Location (TDL)
Author :
Lee, Jeong-Cheol ; Dae-Young Kim
Volume :
1
fYear :
2007
fDate :
12-14 Feb. 2007
Firstpage :
337
Lastpage :
339
Abstract :
TDL is the system that converts the analog process to digital process. During the process of building the substrate, there can be many defects which are generated by both a human and other environmental things. To reduce the redundant process like handling by human-beings, TDL can substitute physical operation for logical process.
Keywords :
bar codes; data communication; optical character recognition; analog process; digital process; logical process; tracing the defect location; Character recognition; Charge coupled devices; Continuous wavelet transforms; Humans; Ink; Laser theory; Optical character recognition software; Shape; Strips; Tellurium; Tracing the Defect Location (IDL); digital process; logicalprocess;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Communication Technology, The 9th International Conference on
Conference_Location :
Gangwon-Do
ISSN :
1738-9445
Print_ISBN :
978-89-5519-131-8
Type :
conf
DOI :
10.1109/ICACT.2007.358367
Filename :
4195146
Link To Document :
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