Title :
A Fundamental Failure Mechanism in Thin Film Metal-Dielectric Structures Observable as a Generated Voltage
Author :
Wortman, J.J. ; Burger, R.M.
Author_Institution :
Research Triangle Institute, Durham, North Carolina
Keywords :
Atmosphere; Chemicals; Dielectric substrates; Dielectrics and electrical insulation; Electrodes; Equations; Failure analysis; Materials reliability; Transistors; Voltage;
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1963.362245
