DocumentCode :
463293
Title :
Application of Flowgraph Techniques to the Solution of Reliability Problems
Author :
Happ, W.W
Author_Institution :
Hughes Semiconductor Division, New Port Beach, California; Arizona State University, Tempe, Arizona
fYear :
1963
fDate :
Sept. 1963
Firstpage :
375
Lastpage :
423
Keywords :
Current density; Equations; Failure analysis; Mathematical model; Mechanical factors; Pattern analysis; Physics; Semiconductor device reliability; Space charge; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location :
Chicago, IL, USA
ISSN :
0097-2088
Type :
conf
DOI :
10.1109/IRPS.1963.362257
Filename :
4207608
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=463293
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