• DocumentCode
    464677
  • Title

    Moisture Ingression Effect on Stress Distributions in NCF-Bonded COG Packages

  • Author

    Tsai, M.Y. ; Wu, C.Y. ; Huang, C.Y. ; Yang, S.S.

  • Author_Institution
    Chang Gung Univ., Tao-Yuan
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    467
  • Lastpage
    474
  • Abstract
    The objective of this paper is to investigate the effect of moisture ingression on stress field of the COG packages with NCF bonding. The coefficients of moisture diffusion and the hygro-strains of the NCF adhesive have been determined by an innovative approach of measuring the out-of-plane deformation of the bi-material specimens during moisture absorption at the condition of 30degC /85%RH using Twyman-Green interferometry, associated with a finite element analysis and bi-material theory. It can be concluded that the stress states of the NCF-bonded COG packages induced by transient moisture ingression have been fully addressed through experimental, theoretical and numerical approaches in this study.
  • Keywords
    adhesive bonding; adhesives; chip scale packaging; diffusion; electronics packaging; finite element analysis; integrated circuit reliability; light interferometry; liquid crystal displays; moisture; stress analysis; NCF-bonded COG packages; Twyman-Green interferometry; anisotropic conductive film adhesives; bi-material plate; bi-material theory; chip-on-glass packages; finer bump pitch feature; finite element analysis; liquid crystal displays; moisture absorption; moisture diffusion coefficients; nonconductive film adhesives; out-of-plane deformation; stress distributions; transient moisture ingression effect; Absorption; Anisotropic conductive films; Bonding; Costs; Finite element methods; Liquid crystal displays; Moisture; Packaging; Polyimides; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373839
  • Filename
    4249925