DocumentCode
464678
Title
Manufacturing and Characterization of Nano Silver Particles Based Thermal Interface Material
Author
Liu, Johan ; Olorunyomi, Michael Olugbenga ; Li, Xin ; Shangguan, Dongkai
Author_Institution
Shanghai Univ., Shanghai
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
475
Lastpage
479
Abstract
Today´s technology is tuned towards faster, smaller and better efficiency. This trend has resulted in tremendous heat being generated in microelectronics components and if not properly managed, it can result in failure of microelectronics components. A critical issue is the removal of this heat generated. We report here a new type of nano thermal interface material (Nano-TIM) using the electrospinning process with nano silver particle as thermal enhancement filler. With the electrospinning process, polymer nanofibers are formed in nano scale in diameters. The morphology of the nanofibers is of optimum importance and scanning electron microscopy (SEM) was used to analyze it. The characterization of the nanofibers was carried out using thermo-gravimetric analyzers (TGA) and differential scanning calorimeter (DSC) to determining the degradation and melting temperature of the nanofibers. The mechanical property was analyzed using an Instron micro-functional mechanical tester. The work shows that nano-TIM with nano silver particles has significant potentials to replace conventional thermal pad materials.
Keywords
differential scanning calorimetry; integrated circuit packaging; nanoparticles; scanning electron microscopy; thermal management (packaging); Instron microfunctional mechanical tester; SEM; differential scanning calorimeter; electrospinning process; microelectronics components; nanofibers characterization; nanosilver particles; nanothermal interface material; scanning electron microscopy; thermal enhancement filler; thermal pad materials; thermogravimetric analyzers; Manufacturing; Mechanical factors; Microelectronics; Morphology; Nanostructured materials; Polymers; Scanning electron microscopy; Silver; Temperature; Thermal degradation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.373840
Filename
4249926
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