DocumentCode :
464757
Title :
Estimation of Capacitive Crosstalk-Induced Short-Circuit Energy
Author :
Mondal, Mosin ; Kirolos, Sami ; Massoud, Yehia
Author_Institution :
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX
fYear :
2007
fDate :
27-30 May 2007
Firstpage :
897
Lastpage :
900
Abstract :
In the nanometer regime, crosstalk significantly impacts the dynamic power consumption of a chip. In this paper, we present a methodology for analyzing crosstalk-induced short-circuit power dissipation in cell-based digital designs. We introduce a new cell pre-characterization technique for facilitating the estimation of crosstalk-induced short-circuit power. Examples demonstrate that the presented methodology is three orders of magnitude faster than circuit simulators while the average error is as low as 3.5%.
Keywords :
crosstalk; integrated circuit design; short-circuit currents; capacitive crosstalk-induced short-circuit energy; cell pre-characterization; cell-based digital designs; dynamic power consumption; power dissipation; Capacitance; Circuit simulation; Coupling circuits; Crosstalk; Energy consumption; Integrated circuit interconnections; Noise reduction; Power dissipation; Voltage; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
Type :
conf
DOI :
10.1109/ISCAS.2007.378070
Filename :
4252780
Link To Document :
بازگشت