Title :
Electrical Stress-free High Gain and High Swing Analog Buffer Using an Adaptive Biasing Scheme
Author :
Dabag, Hayg ; Seo, Dongwon ; Mishra, Manu ; Hausner, Josef
Author_Institution :
Inst. for Integrated Syst., Ruhr-Univ. of Bochum
Abstract :
Analog circuit design techniques to avoid electrical stress are presented. A dual logic scheme and an adaptively biased common source output buffer are used to meet a reliability guideline that ensures sufficient lifetime. Both techniques are successfully used to implement an operational amplifier in a 45-nm standard CMOS process.
Keywords :
CMOS integrated circuits; analogue circuits; operational amplifiers; 45 nm; CMOS process; adaptive biasing scheme; adaptively biased common source output buffer; analog buffer; analog circuit design techniques; dual logic scheme; operational amplifier; Analog circuits; CMOS technology; Diodes; Guidelines; Logic circuits; Logic devices; MOS devices; Operational amplifiers; Stress; Voltage;
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
DOI :
10.1109/ISCAS.2007.378082
