• DocumentCode
    464784
  • Title

    Further Improve Excellent Graph-Based FPGA Technology Mapping by Rewiring

  • Author

    Tang, Wai-Chung ; Lo, Wing-Hang ; Wu, Yu-Liang

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong
  • fYear
    2007
  • fDate
    27-30 May 2007
  • Firstpage
    1049
  • Lastpage
    1052
  • Abstract
    FPGA technology mapping is conventionally solved without altering the circuit by modeling the circuit as a direct acyclic graph for the ease of applying graph algorithms. Clearly there is room for further improvement on even optimal technology mapping results if logic perturbation can be applied. In this paper, we propose logic-aware minimization methods to further reduce both depth and area for the purely-graph-based depth-optimal FPGA mapped results. For area minimization, the proposed method perturbs the subject circuit using rewiring technique and incrementally reduce the mapping area. Improving the outstanding technology mapping algorithm DAOMap, the method can further reduce area by 10.9%. An area reduction of 13.4% is achieved with synthesis results from BDS-pga. A logic level reduction scheme is also proposed and it further reduces LUT depth for half of the circuits tested without area penalty. A combination of logic level reduction and area minimization techniques can improve both the LUT depth and area by 11.3% and 6.1%, compared to results of FlowMap and FlowSYN respectively.
  • Keywords
    directed graphs; field programmable gate arrays; minimisation of switching nets; direct acyclic graph; graph-based FPGA technology mapping; logic-aware minimization methods; rewiring technique; Circuit synthesis; Circuit testing; Computer science; Delay; Field programmable gate arrays; Logic circuits; Logic testing; Minimization methods; Table lookup; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-4244-0920-9
  • Electronic_ISBN
    1-4244-0921-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2007.378150
  • Filename
    4252818