• DocumentCode
    464996
  • Title

    Fault Tolerant Signal Processing for Masking Transient Errors in VLSI Signal Processors

  • Author

    Jenkins, W.K. ; Radhakrishnan, C. ; Pal, S.

  • Author_Institution
    Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA
  • fYear
    2007
  • fDate
    27-30 May 2007
  • Firstpage
    2570
  • Lastpage
    2573
  • Abstract
    This paper proposes fault tolerant signal processing strategies for achieving reliable performance in VLSI signal processors that are prone to transient errors due to increasingly smaller feature dimensions and supply voltages. The proposed methods are based on residue number system (RNS) coding, involving either hardware redundancy or multiple execution redundancy (MER) strategies designed to identify and overcome transient errors. RNS techniques provide powerful low-redundancy fault tolerance properties that must be introduced at VLSI design levels, whereas MER strategies generally require higher degrees of redundancy that can be introduced at software programming levels.
  • Keywords
    VLSI; digital signal processing chips; fault tolerance; residue number systems; VLSI design levels; VLSI signal processors; fault tolerant signal processing; hardware redundancy; multiple execution redundancy strategies; residue number system coding; transient errors; Arithmetic; Computer errors; Digital signal processing; Error correction; Fault tolerance; Hardware; Redundancy; Signal processing; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-4244-0920-9
  • Electronic_ISBN
    1-4244-0921-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2007.377840
  • Filename
    4253202