DocumentCode
464996
Title
Fault Tolerant Signal Processing for Masking Transient Errors in VLSI Signal Processors
Author
Jenkins, W.K. ; Radhakrishnan, C. ; Pal, S.
Author_Institution
Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA
fYear
2007
fDate
27-30 May 2007
Firstpage
2570
Lastpage
2573
Abstract
This paper proposes fault tolerant signal processing strategies for achieving reliable performance in VLSI signal processors that are prone to transient errors due to increasingly smaller feature dimensions and supply voltages. The proposed methods are based on residue number system (RNS) coding, involving either hardware redundancy or multiple execution redundancy (MER) strategies designed to identify and overcome transient errors. RNS techniques provide powerful low-redundancy fault tolerance properties that must be introduced at VLSI design levels, whereas MER strategies generally require higher degrees of redundancy that can be introduced at software programming levels.
Keywords
VLSI; digital signal processing chips; fault tolerance; residue number systems; VLSI design levels; VLSI signal processors; fault tolerant signal processing; hardware redundancy; multiple execution redundancy strategies; residue number system coding; transient errors; Arithmetic; Computer errors; Digital signal processing; Error correction; Fault tolerance; Hardware; Redundancy; Signal processing; Threshold voltage; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location
New Orleans, LA
Print_ISBN
1-4244-0920-9
Electronic_ISBN
1-4244-0921-7
Type
conf
DOI
10.1109/ISCAS.2007.377840
Filename
4253202
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