Title :
CNN Implementation of Spin Filters for Electronic Speckle Pattern Interferometry Applications
Author :
VilariÑo, David L. ; Brea, V.M. ; Moreno, Vicente ; Cabello, Diego
Author_Institution :
Dept. of Electron. & Comput. Sci., Santiago de Compostela Univ.
Abstract :
Electronic speckle pattern interferometry (ESPI) is a well-known technique in the realm of optoelectronics by which a fringe pattern is formed when two coherent light beams (typically lasers) interfere after, at least one of them, is reflected off a rough surface. The resultant image is acquired by electronic means, with either a CCD camera or CMOS imagers. Observation of the fringe pattern gives information about a measurement. Examples of such measurements are displacement of an object, surface deformation, vibration, velocity, etc. Image analysis is required to read and interpret the underlying information conveyed in the fringe pattern. This paper merges ESPI with cellular non-linear networks (CNN). The final goal is to run ESPI image processing on CMOS CNN-based chips to cover applications with hard time requirements. The current work addresses the first stage which is noise removal through spin filters with CNN operators.
Keywords :
CMOS image sensors; cellular neural nets; electronic speckle pattern interferometry; optical filters; CMOS CNN-based chips; CNN implementation; ESPI image processing; cellular nonlinear networks; electronic speckle pattern interferometry; image analysis; spin filters; Cellular neural networks; Charge coupled devices; Filters; Laser beams; Optical interferometry; Rough surfaces; Speckle; Surface emitting lasers; Surface roughness; Vibration measurement;
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
DOI :
10.1109/ISCAS.2007.377964