DocumentCode
465254
Title
Escape Routing For Dense Pin Clusters In Integrated Circuits
Author
Ozdal, Muhammet Mustafa
Author_Institution
Intel Corp., Hillsboro
fYear
2007
fDate
4-8 June 2007
Firstpage
49
Lastpage
54
Abstract
As the design complexities and circuit densities are increasing, the detailed routing (DR) problem is becoming a more and more challenging problem. Due to the high complexity of DR algorithms, it is very important to start the routing process with clean solutions, rather than starting with suboptimal routes and trying to fix them in iterative process. In this paper, we propose an escape routing algorithm that can optimize routing of a set of nets around their terminals. For this, we first propose a polynomial-time algorithm that guarantees to find the optimal escape routing solution for a set of nets when the track structures are uniform. Then, we use this algorithm as a baseline, and study the general problem with arbitrary track structures. For this, we propose a novel multi-commodity flow (MCF) model that has a one-to-one correspondence with the escape routing problem. This MCF model is novel in the sense that the inter-dependency and contention between different flow commodities is minimal. Using this model, we propose a Lagrangian-relaxation (LR) based algorithm to solve the escape problem. Our experiments demonstrate that this algorithm improves the overall routability significantly by reducing the number of nets that require rip-up and reroute.
Keywords
computational complexity; integrated circuit design; network routing; Lagrangian-relaxation algorithm; circuit densities; dense pin clusters; detailed routing; escape routing; integrated circuit; multicommodity flow; polynomial-time algorithm; Algorithm design and analysis; Circuits; Clustering algorithms; Design for manufacture; Hardware; Iterative algorithms; Lagrangian functions; Polynomials; Routing; Wire; Algorithms; Design; Detailed routing; escape routing; multi-commodity flow;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location
San Diego, CA
ISSN
0738-100X
Print_ISBN
978-1-59593-627-1
Type
conf
Filename
4261142
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