DocumentCode :
465302
Title :
Design and Analysis of Hybrid NEMS-CMOS Circuits for Ultra Low-Power Applications
Author :
Dadgour, Hamed F. ; Banerjee, Kaustav
Author_Institution :
Univ. of California, Santa Barbara
fYear :
2007
fDate :
4-8 June 2007
Firstpage :
306
Lastpage :
311
Abstract :
Integration of nano-electro-mechanical switches (NEMS) with CMOS technology has been proposed to exploit both near zero-leakage characteristics of NEMS devices along with high ON current of CMOS transistors. The feasibility of integration of NEMS switches into a CMOS process is illustrated by a practical process flow. Moreover, co- design of hybrid NEMS-CMOS as low power dynamic OR gates, SRAM cells, and sleep transistors is explored. Simulation results indicate that such hybrid dynamic OR gates can achieve 60-80% lower switching power and almost zero leakage power consumption with minor delay penalty. However, the hybrid gate outperforms its CMOS counterpart both in terms of delay and switching power consumption with increase in fan-in beyond 12. Additionally, it is shown that the proposed hybrid SRAM cell can achieve almost 8times lower standby leakage power consumption with only minor noise margin and latency cost. Finally, application of NEMS devices as sleep transistors results in upto three orders of magnitude lower OFF current with negligible performance degradation as compared to CMOS sleep switches.
Keywords :
CMOS integrated circuits; SRAM chips; nanoelectronics; semiconductor switches; transistors; CMOS transistors; OR gates; SRAM cells; hybrid NEMS-CMOS circuits; nano-electro-mechanical switches; sleep transistors; ultra low-power applications; CMOS process; CMOS technology; Circuits; Delay; Energy consumption; Nanoelectromechanical systems; Nanoscale devices; Random access memory; Sleep; Switches; Design; Hybrid NEMS-CMOS technology; Leakage power; Low-power design; Nano-electromechanical switches; Performance; Reliability; Suspended-gate MOSFET; VLSI;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location :
San Diego, CA
ISSN :
0738-100X
Print_ISBN :
978-1-59593-627-1
Type :
conf
Filename :
4261196
Link To Document :
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