Title :
Automated Design of Misaligned-Carbon-Nanotube-Immune Circuits
Author :
Patil, Nishant ; Deng, Jie ; Wong, H.-S.P. ; Mitra, Subhasish
Author_Institution :
Stanford Univ., Stanford
Abstract :
Carbon nanotube field-effect transistors (CNFETs) are promising candidates as extensions to silicon CMOS due to excellent CV/I device performance. An ideal CNFET inverter fabricated using a perfect CNFET technology can have 5.1 times faster FO4 delay and 2.6 times lower energy per cycle compared to a 32 nm silicon CMOS inverter. Two fundamental challenges prevent us from creating CNFET-based logic designs with the advantages quoted above: 1. misaligned carbon nanotubes (CNTs), and 2. Metallic CNTs. Misaligned CNTs can result in incorrect logic function implementations. This paper presents a technique for designing CNFET-based arbitrary logic functions that are guaranteed to be correct even in the presence of a large number of misaligned CNTs.
Keywords :
CMOS logic circuits; carbon nanotubes; field effect transistors; logic design; logic gates; nanotube devices; silicon; arbitrary logic functions; logic designs; metallic carbon nanotube field-effect transistor inverter; misaligned carbon nanotube immune circuits; silicon CMOS; CMOS technology; Carbon nanotubes; Circuits; Etching; Inverters; Lithography; Logic functions; Permission; Semiconductivity; Silicon; Algorithms; CNFET; CNT; Carbon Nanotube Transistor; Circuits; Design; Fault tolerance; Misaligned Carbon Nanotubes Immune; Reliability;
Conference_Titel :
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-59593-627-1