DocumentCode
465505
Title
Aggressive Area Scaling in Passive Transresistance Networks
Author
Fei, Haibo ; Geiger, Randall L.
Author_Institution
Dept. of Electrical and Computer Engineering, Iowa State University, Ames, IA U.S.A. 50011
Volume
1
fYear
2006
fDate
6-9 Aug. 2006
Firstpage
536
Lastpage
539
Abstract
the issue of very aggressive area scaling to practically achieve large transresistance in a small amount of area is addressed. Closed form analytical expressions for the area scaling efficiency for an R-2R transresistance network and a ladder-based transresistance network are presented. Closed form analytical expressions and numerical comparisons for the standard deviation of the transresistance of these networks that are useful for determining ratio matching yield are also included.
Keywords
Active filters; CMOS process; Computer networks; Feedback amplifiers; Frequency; Printed circuits; Resistors; Signal processing; Silicides; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
Conference_Location
San Juan, PR
ISSN
1548-3746
Print_ISBN
1-4244-0172-0
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2006.382117
Filename
4267194
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