• DocumentCode
    465505
  • Title

    Aggressive Area Scaling in Passive Transresistance Networks

  • Author

    Fei, Haibo ; Geiger, Randall L.

  • Author_Institution
    Dept. of Electrical and Computer Engineering, Iowa State University, Ames, IA U.S.A. 50011
  • Volume
    1
  • fYear
    2006
  • fDate
    6-9 Aug. 2006
  • Firstpage
    536
  • Lastpage
    539
  • Abstract
    the issue of very aggressive area scaling to practically achieve large transresistance in a small amount of area is addressed. Closed form analytical expressions for the area scaling efficiency for an R-2R transresistance network and a ladder-based transresistance network are presented. Closed form analytical expressions and numerical comparisons for the standard deviation of the transresistance of these networks that are useful for determining ratio matching yield are also included.
  • Keywords
    Active filters; CMOS process; Computer networks; Feedback amplifiers; Frequency; Printed circuits; Resistors; Signal processing; Silicides; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
  • Conference_Location
    San Juan, PR
  • ISSN
    1548-3746
  • Print_ISBN
    1-4244-0172-0
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2006.382117
  • Filename
    4267194