DocumentCode :
465740
Title :
Applying Novel QuickLearn Algorithm for Pattern Recognition
Author :
Akhbardeh, Alireza ; Värri, Alpo
Author_Institution :
Tampere Univ. of Technol., Tampere
Volume :
1
fYear :
2006
fDate :
8-11 Oct. 2006
Firstpage :
851
Lastpage :
855
Abstract :
In this paper we describe novel QuickLearn (QL) algorithm for pattern classification which has two steps. The mapping level, first step, includes a multi input-single output mapping function (MF) with fixed weights and input data were presented to it during the training phase. It is only a kind of data shifting and scaling before presenting to next level. After shifting and scaling output of first step which is a scalar value to the range [0,T], we can round it to have an integer value (y). The second step, matching level, only includes an array with T cells called affine look-up table (ALT). The training phase for QL includes only one step, no learning cycles. In this single step, the integer value y is used as a reference address to call and upload the label for corresponding input samples in N cells of ALT (copy label from the cell [y-N/2] to the cell [y+ N/2-1]) (data leakages to N-l neighbor cells). In the testing phase, we need only to recall and introduce value of the cell with the index y as the final output (final winner class). The QL is evaluated and compared with existing supervised neural networks on a variety of some well known pattern classification problems. Elapsed time for training a fresh QL classifier is typically only few milliseconds.
Keywords :
learning (artificial intelligence); pattern classification; table lookup; QuickLearn algorithm; affine look-up table; mapping function; pattern classification; pattern recognition; supervised neural networks; Availability; Classification algorithms; Cybernetics; Neural networks; Pattern classification; Pattern recognition; Resonance; Supervised learning; Table lookup; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man and Cybernetics, 2006. SMC '06. IEEE International Conference on
Conference_Location :
Taipei
Print_ISBN :
1-4244-0099-6
Electronic_ISBN :
1-4244-0100-3
Type :
conf
DOI :
10.1109/ICSMC.2006.384495
Filename :
4273942
Link To Document :
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