• DocumentCode
    466024
  • Title

    An Extended Object-oriented Petri Nets Modeling Based Simulation Platform for Real-time Scheduling of Semiconductor Wafer Fabrication System

  • Author

    Zhang, Huai ; Jiang, Zhibin ; Guo, Chengtao ; Liu, Huiran

  • Author_Institution
    Shanghai Jiao Tong Univ., Shanghai
  • Volume
    4
  • fYear
    2006
  • fDate
    8-11 Oct. 2006
  • Firstpage
    3411
  • Lastpage
    3416
  • Abstract
    Real-time scheduling of semiconductor wafer fabrication system (SWFS) is complicated due to the following factors: re-entrant product flow, high uncertainties in operations and rapidly changing products and technologies. This paper presents a simulation platform for real-time scheduling of SWFS, which is designed and developed based on extended object-oriented petri net (EOPN) to describe the complicated wafer fabrication process and serve as the foundation of realtime scheduling. In addition, a dynamic bottleneck dispacthing (DBD) algorithm is designed to detect bottlenecks in a timely way and make adaptive dispatching decisions according to the real-time conditions. The results of the simulation experiments and analysis show that the DBD algorithm is superior to CR+FIFO and EDD methods.
  • Keywords
    Petri nets; digital simulation; electronic design automation; electronic engineering computing; integrated circuit manufacture; object-oriented methods; scheduling; EOPN; Simulation Platform; dynamic bottleneck dispatching algorithm; extended object-oriented Petri net; real-time scheduling; semiconductor wafer fabrication; Computational modeling; Dispatching; Fabrication; Job shop scheduling; Object oriented modeling; Petri nets; Processor scheduling; Real time systems; Semiconductor device modeling; Uncertainty; extended object-oriented petri net (EOPN); real-time scheduling; semiconductor wafer fabrication system (SWFS); simulation platform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man and Cybernetics, 2006. SMC '06. IEEE International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    1-4244-0099-6
  • Electronic_ISBN
    1-4244-0100-3
  • Type

    conf

  • DOI
    10.1109/ICSMC.2006.384646
  • Filename
    4274410