DocumentCode
46712
Title
The Driving Conditions for Obtaining Subnanosecond High-Voltage Pulses From a Silicon-Avalanche-Shaper Diode
Author
Merensky, L.M. ; Kardo-Sysoev, A.F. ; Shmilovitz, D. ; Kesar, A.S.
Author_Institution
Appl. Phys. Div., Soreq Nucl. Res. Center, Yavne, Israel
Volume
42
Issue
12
fYear
2014
fDate
Dec. 2014
Firstpage
4015
Lastpage
4019
Abstract
Silicon-avalanche-shaper (SAS) diodes are fast-closing switches capable of producing high-voltage pulses with a rise time of ~100 ps. The SAS can be driven by a positive, nanosecond scale, high-voltage pulse applied to its cathode where the magnitude of the driving pulse is correlated to the magnitude of the pulse at the SAS anode (output). Drift-step-recovery diodes (DSRDs) are fast-opening switches capable of producing high-voltage pulses with a rise time of the order of 1 ns. Thus, DSRDs are good candidates for driving SAS diodes. In this paper, the SAS output is studied with respect to its driving conditions. First, the SAS output is examined with respect to the magnitude and rise time of the driving pulse, utilizing three DSRDs to produce pulses with various rise times from 0.5 to 5 ns. In addition, the effect of the driving pulse repetition frequency (PRF) on the SAS output is studied. An experimental demonstration using a 1.5-kV SAS fabricated at the Ioffe Physical Technical Institute shows the advantage of driving the SAS with the short, 0.5 ns, pulses, and the degradation of performance due to high PRF, up to 10 MHz.
Keywords
avalanche diodes; power semiconductor diodes; power semiconductor switches; drift step recovery diode; driving condition; driving pulse repetition frequency; fast closing switch; silicon avalanche shaper diode; subnanosecond high voltage pulse; voltage 1.5 kV; Capacitors; Impact ionization; Plasmas; Semiconductor diodes; Silicon; Synthetic aperture sonar; Power semiconductor diode switches; pulse generation; silicon-avalanche-shaper (SAS); silicon-avalanche-shaper (SAS).;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2014.2366551
Filename
6960896
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