DocumentCode
4674
Title
LockSim: An Event-Driven Simulator for Modeling Spin Lock Contention
Author
Yan Cui ; Yingxin Wang ; Yu Chen ; Yuanchun Shi
Author_Institution
CS Dept., Columbia Univ., Columbia, NY, USA
Volume
26
Issue
1
fYear
2015
fDate
Jan. 2015
Firstpage
185
Lastpage
195
Abstract
Spin lock contention in operating systems can limit scalability on multicore systems so significantly that an increase in the number of cores actually leads to reduced speedup (i.e., scalability collapse). Modeling spin lock contention is an effective way to understand the scalability collapse phenomenon and explore collapse avoidance schemes. However, previous spin lock models have disadvantages in accuracy and efficiency. To overcome these drawbacks, this paper proposes LockSim, an event-driven simulator which models both the sequential execution in lock-protected codes (i.e., critical sections) and shared hardware resource contention caused by the cache coherence protocol. Our simulator is verified against real-world workloads with different degrees of spin lock contention. Experimental results suggest that LockSim can reproduce the scalability collapse phenomenon with better accuracy than previous work. Besides, several metrics are also used to characterize this phenomenon and collapse avoidance methods are investigated.
Keywords
discrete event simulation; multiprocessing systems; operating system kernels; protocols; LockSim; cache coherence protocol; collapse avoidance methods; collapse avoidance schemes; event-driven simulator; lock-protected codes; modeling spin lock contention; multicore systems; operating systems; real-world workloads; scalability collapse phenomenon; sequential execution; shared hardware resource contention; spin lock models; Accuracy; Analytical models; Hardware; Load modeling; Multicore processing; Protocols; Scalability; Scalability collapse; event-driven simulator; lock contention; multicore; operating systems;
fLanguage
English
Journal_Title
Parallel and Distributed Systems, IEEE Transactions on
Publisher
ieee
ISSN
1045-9219
Type
jour
DOI
10.1109/TPDS.2014.2308220
Filename
6748069
Link To Document