DocumentCode :
467432
Title :
Electromodulation-Absorption Type Spectroscopy of Semiconductor Structures Applied in Telecommunication Lasers
Author :
Misiewicz, Jan ; Sek, Grzegorz ; Kudrawiec, Robert ; Motyka, M.
Author_Institution :
Inst. of Phys. Wroclaw Univ. of Technol., Warsaw
Volume :
2
fYear :
2007
fDate :
1-5 July 2007
Firstpage :
260
Lastpage :
262
Abstract :
We have presented two contactless modes of electromodulation spectroscopy as tools for detailed nondestructive characterization of low dimensional semiconductor device structures. Several examples have been shown for different solutions of the laser structures for applications in 1.3 - 1.55 mum telecommunication range. The ways for determining their fundamental properties which are related then to the device parameters have been discussed.
Keywords :
modulation spectroscopy; quantum dot lasers; quantum well lasers; semiconductor devices; electromodulation-absorption type spectroscopy; nondestructive characterization; quantum dots; quantum well; semiconductor device structures; telecommunication lasers; Gallium arsenide; Laser theory; Optical buffering; Optical materials; Optical modulation; Quantum dot lasers; Quantum dots; Quantum well lasers; Semiconductor lasers; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transparent Optical Networks, 2007. ICTON '07. 9th International Conference on
Conference_Location :
Rome
Print_ISBN :
1-4244-1249-8
Electronic_ISBN :
1-4244-1249-8
Type :
conf
DOI :
10.1109/ICTON.2007.4296198
Filename :
4296198
Link To Document :
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