• DocumentCode
    4677
  • Title

    Sub-Nyquist Sampling Jamming Against ISAR With Compressive Sensing

  • Author

    Wei Wang ; Xiao-Yi Pan ; Yong-Cai Liu ; De-Jun Feng ; Qi-Xiang Fu

  • Author_Institution
    State Key Lab. of Complex Electromagn. Environ. Effects on Electron. & Inf. Syst., Nat. Univ. of Defense Technol., Changsha, China
  • Volume
    14
  • Issue
    9
  • fYear
    2014
  • fDate
    Sept. 2014
  • Firstpage
    3131
  • Lastpage
    3136
  • Abstract
    Shannon-Nyquist theorem indicates that under-sampling at low rates will lead to aliasing in the frequency domain of signal and can be utilized in electronic warfare. However, the question is whether it still works when the compressive sensing (CS) algorithm is applied into reconstruction of target. This paper concerns sub-Nyquist sampled jamming signals and its corresponding influence on inverse synthetic aperture radar (ISAR) imaging via CS. Results show that multiple deceptive false-target images with finer resolution will be induced after the sub-Nyquist sampled jamming signals dealed with CS-based reconstruction algorithm; hence, the sub-Nyquist sampling can be adopted in the generation of decoys against ISAR with CS. Experimental results of the scattering model of the Yak-42 plane and real data are used to verify the correctness of the analyses.
  • Keywords
    compressed sensing; image reconstruction; image resolution; image sampling; jamming; radar imaging; synthetic aperture radar; CS-based reconstruction algorithm; ISAR imaging; Shannon-Nyquist theorem; Yak-42 plane; compressive sensing algorithm; decoy generation; electronic warfare; frequency domain analysis; inverse synthetic aperture radar imaging; multiple deceptive false-target image resolution; scattering model; subNyquist sampled jamming signal; Compressed sensing; Image resolution; Imaging; Jamming; Radar imaging; Scattering; Sub-Nyquist sampling; compressive sensing (CS); deception jamming; inverse syntheticaperture radar (ISAR);
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2014.2323978
  • Filename
    6815640