• DocumentCode
    468163
  • Title

    A Double Layer Bayesian Classifier

  • Author

    Sun, Jiangwen ; Wang, Chongjun ; Chen, Shifu

  • Author_Institution
    Nanjing Univ., Nanjing
  • Volume
    1
  • fYear
    2007
  • fDate
    24-27 Aug. 2007
  • Firstpage
    540
  • Lastpage
    544
  • Abstract
    Numerous approaches have been proposed to relax the conditional independence assumption of naive Bayes, the accuracy performance was indeed improved relative to naive Bayes when the assumption is violated. But most of the previous approaches treated the attribute relation in the same way for all class labels. In practice, this relation may be different for different class labels. This paper proposes a novel approach, by which the posterior probability of different class label is evaluated using different attribute relation. Experiment results indicate that the new approach obtains comparative performance relative to other modern Bayesian classifiers on some datasets, and on some other datasets it outperforms the others.
  • Keywords
    Bayes methods; pattern classification; double layer Bayesian classifier; naive Bayes; posterior probability; Bayesian methods; Classification tree analysis; Decision trees; Laboratories; Probability; Software performance; Statistics; Sun; Testing; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fuzzy Systems and Knowledge Discovery, 2007. FSKD 2007. Fourth International Conference on
  • Conference_Location
    Haikou
  • Print_ISBN
    978-0-7695-2874-8
  • Type

    conf

  • DOI
    10.1109/FSKD.2007.21
  • Filename
    4405983