DocumentCode
468163
Title
A Double Layer Bayesian Classifier
Author
Sun, Jiangwen ; Wang, Chongjun ; Chen, Shifu
Author_Institution
Nanjing Univ., Nanjing
Volume
1
fYear
2007
fDate
24-27 Aug. 2007
Firstpage
540
Lastpage
544
Abstract
Numerous approaches have been proposed to relax the conditional independence assumption of naive Bayes, the accuracy performance was indeed improved relative to naive Bayes when the assumption is violated. But most of the previous approaches treated the attribute relation in the same way for all class labels. In practice, this relation may be different for different class labels. This paper proposes a novel approach, by which the posterior probability of different class label is evaluated using different attribute relation. Experiment results indicate that the new approach obtains comparative performance relative to other modern Bayesian classifiers on some datasets, and on some other datasets it outperforms the others.
Keywords
Bayes methods; pattern classification; double layer Bayesian classifier; naive Bayes; posterior probability; Bayesian methods; Classification tree analysis; Decision trees; Laboratories; Probability; Software performance; Statistics; Sun; Testing; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Fuzzy Systems and Knowledge Discovery, 2007. FSKD 2007. Fourth International Conference on
Conference_Location
Haikou
Print_ISBN
978-0-7695-2874-8
Type
conf
DOI
10.1109/FSKD.2007.21
Filename
4405983
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