Title :
Investigation of the Effect of PCB Base Materials and Pad Surface Finish on the Thermal Fatigue Life of Lead-free Solder Joints of PBGA and Passive Resistors
Author :
Song, Fubin ; Lee, S. W Ricky ; Osterman, Michael ; Pecht, Michael
Author_Institution :
Hong Kong Univ. of Sci. & Technol., Hong Kong
Abstract :
Legislation that mandates the banning of lead in electronics due to environmental and health concerns has been actively pursued in many countries during the past fifteen years. Although a large number of research studies have been performed and are currently under way in the lead-free solder area, especially on the reliability of lead-free solder joints, abundant data exists predominantly on the short-term reliability (that is, less than five years) of lead-free solder joints under single-loading conditions. Data on long-term reliability is scarce. Lead-free electronics will be deployed in many products that serve markets where long-term reliability is a critical requirement. This paper presents a design-of-experiment reliability study of lead-free solder joints. The printed circuit board (with different base materials: FR4, HT-FR4, and PI) test assemblies include two types of components (PBGA and 2512 resistors), with various terminal metallurgies, several PCB pad finishes (HASL, ImSn, ImAg, ENIG, and OSP), and two solder alloys (SnPb and Sn3.0%Ag0.5%Cu). The test vehicle design, experimental set-up, results, and failure analysis are presented here.
Keywords :
environmental factors; health and safety; lead alloys; printed circuits; resistors; solders; PBGA; PCB base materials; PCB pad finishes; design-of-experiment reliability; failure analysis; lead banning; lead-free electronics; lead-free solder joints; pad surface finish; passive resistors; printed circuit board; solder alloys; terminal metallurgies; test vehicle design; thermal fatigue life; Circuit testing; Consumer electronics; Environmentally friendly manufacturing techniques; Fatigue; Joining materials; Lead; Resistors; Soldering; Surface finishing; Thermal resistance;
Conference_Titel :
Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
Conference_Location :
Kowloon
Print_ISBN :
978-1-4244-0834-4
Electronic_ISBN :
978-1-4244-0834-4
DOI :
10.1109/EMAP.2006.4430585