• DocumentCode
    469367
  • Title

    An Accurate Solution for Thermo-mechanical Stresses in Tri-Material Assembly in Electronic Packages

  • Author

    Sujan, D. ; Sridhar, T.S. ; Seetharamu, K.N. ; Murthy, M.V.V. ; Hassan, A.Y.

  • Author_Institution
    Multimedia Univ., Melaka
  • fYear
    2006
  • fDate
    11-14 Dec. 2006
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The closed-form solution of thermo-mechanical analysis of tri-material assembly is initially provided by Schmidt in 1999 and Suhir in 2003. However, there exist some contradictions and inconsistencies in both the solutions of Schmidt and Suhir. The contradiction arises in consideration of the exponent parameter k in the characteristic equation. Both Schmidt and Suhir showed that the exponent parameter k in the shearing stresses contains two roots. But for no particular reason both of them considered only one root for k and as a consequence it leads to an ambiguous and incorrect solution. In the present paper a complete model for shearing stress for uniform temperature change is presented using both the roots for k. Subsequently a model for peeling stress is proposed from the consideration of moment equilibrium combined with the above mentioned shearing stress model. The contradictions in Schmidt´s and Suhir´s solutions are clearly highlighted in this paper. Analytical and FEM solutions are presented for the same tri-material package as used by Suhir. The comparison of the analytical results and the numerical simulation is in a good matching agreement.
  • Keywords
    assembling; electronics packaging; finite element analysis; shear strength; thermal management (packaging); thermomechanical treatment; FEM solutions; closed-form solution; electronic packages; exponent parameter; moment equilibrium; peeling stress; shearing stress model; thermo-mechanical stresses; tri-material assembly; Assembly; Closed-form solution; Educational institutions; Electronic packaging thermal management; Integral equations; Mechanical engineering; Shearing; Temperature; Thermal stresses; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
  • Conference_Location
    Kowloon
  • Print_ISBN
    978-1-4244-0834-4
  • Electronic_ISBN
    978-1-4244-0834-4
  • Type

    conf

  • DOI
    10.1109/EMAP.2006.4430598
  • Filename
    4430598