DocumentCode :
469584
Title :
A 130nm CMOS digitizer prototype chip for Silicon strips detectors readout
Author :
Da Silva, W. ; David, J. ; Dhellot, M. ; Fougeron, D. ; Genat, J.-F. ; Hermel, R. ; Huppert, J.-F. ; Kapusta, F. ; Lebbolo, H. ; Pham, T.-H. ; Rossel, F. ; Savoy-Navarro, A. ; Sefri, R.
Author_Institution :
Centre Nat. de la Recherche Sci. (CNRS), Paris
Volume :
3
fYear :
2007
fDate :
Oct. 26 2007-Nov. 3 2007
Firstpage :
1861
Lastpage :
1864
Abstract :
A 130 nm CMOS evaluation chip intended to read Silicon strip detectors has been designed and successfully tested. Optimized for a detector capacitance of 10 pF, it includes four channels of a full signal processing chain, including low-noise charge integration and pulse shaping, a 16 deep-analog sampler triggered on an analogue sum of adjacent inputs, and a parallel 10-bit analog to digital conversion. Laboratory and in-situ tests results of the chip are reported, demonstrating the behavior and performance of the full sampling process and analog to digital conversion, on a laboratory test stand, and from radioactive source as well as beam tests. Each channel occupies an area of 100 times 600 square microns on Silicon, and dissipates less than half a milliwatt of static power.
Keywords :
CMOS analogue integrated circuits; CMOS digital integrated circuits; analogue-digital conversion; integrated circuit design; integrated circuit testing; position sensitive particle detectors; pulse shaping; readout electronics; silicon radiation detectors; CMOS digitizer prototype chip; analog-digital conversion; capacitance 10 pF; deep-analog sampler trigger; low-noise charge integration; pulse shaping; radioactive source; sampling process; signal processing chain; silicon strips detectors readout; size 130 nm; Analog-digital conversion; Capacitance; Detectors; Digital signal processing chips; Laboratories; Prototypes; Pulse shaping methods; Silicon; Strips; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location :
Honolulu, HI
ISSN :
1095-7863
Print_ISBN :
978-1-4244-0922-8
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2007.4436520
Filename :
4436520
Link To Document :
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